ICテストプローブ
3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052EF23-02F0
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ICテストプローブ
DE4-052EF23-02F0
ICテストプローブ
Part No.:DE4-052EF23-02F0
Single Active
Length
3.35mm
Tube OD
0.52mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Conical 90°, 120° (E)
Resistance
50mΩ
Spring Force
35g
Description
DE4-052EF23-02F0 is a 3.35 mm long IC test probe with a barrel diameter of 0.52 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.35 mm
Barrel OD0.52 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force35 g ±20%
Recommended Travel0.45 mm
Total Travel0.65 mm
Life Cycles200,000 cycles
Contact Resistance50 mΩ
Lead Time21 days
Impedance41.5 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@3.45GHz
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

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