IC 테스트 프로브
2.20 mm, IC Test Probes, 0.29 mm Diameter, PE4-029DF15-02F0
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IC 테스트 프로브
PE4-029DF15-02F0
IC 테스트 프로브
Part No.:PE4-029DF15-02F0
Single Active
Length
2.20mm
Tube OD
0.29mm
DUT Tip Type
4 Points Crown(F)
Spring Force
25g
Description
PE4-029DF15-02F0 is a 2.20 mm IC test probe with a barrel outer diameter of 0.29 mm. Featuring a Single Active structure, it is designed for semiconductor IC testing applications.
Product Specifications
StructureSingle Active
Length2.20 mm
Barrel OD0.29 mm
DUT Contact Tip Type4 Points Crown(F)
Spring Force25 g ±20%
Recommended Travel0.4 mm
Total Travel0.45 mm
Life Cycles200,000 cycles
Lead Time21 days
DUT Tip Base MaterialPd Alloy
DUT Tip Platingn/a
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated.SUS with Au plated

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