IC 테스트 프로브
5.30 mm, IC Test Probes, 0.29 mm Diameter, DE4-029FF35-01A0
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IC 테스트 프로브
DE4-029FF35-01A0
IC 테스트 프로브
Part No.:DE4-029FF35-01A0
Single Active
Length
5.30mm
Tube OD
0.29mm
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
4 Pts Serrated (P)
Spring Force
25g
Description
DE4-029FF35-01A0 is a 5.30 mm long IC test probe with a barrel diameter of 0.29 mm. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length5.30 mm
Barrel OD0.29 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip Type4 Points Serrated(P)
Spring Force25 g ±20%
Recommended Travel0.5 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
Lead Time21 days
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialSK4
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated

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