Shop
Double active, 4.6 mm, IC Test Probes, 0.26 mm Diameter, 1A
Double active, 4.6 mm, IC Test Probes, 0.26 mm Diameter, 1A
| Category |
IC Test Probes
|
| Part Number |
WE1-026EF31-01A0
|
| Structure |
Double Active
|
| Length |
4.60
|
| Barrel Outer Diameter | |
| Tip for DUT |
4 Points Crown(F)
|
| Tip for Load Board |
Conical 90º,120º(E)
|
| Rated Current |
1
|
| Contact Resistance |
175
|
| Datasheet | WE1-026EF31-01A0 Datasheet.pdf |
| 3D CAD | WE1-026EF31-01A0.STEP |
Get a Quotation
| Ships from | Taiiwan |
| Lead Time | 21 |
Product Specifications
| Impedance | 57 |
| Insertion Loss | -1dB>20GHz |
| Return Loss | -20dB@8.38GHz |
| Tip Base for DUT | BeCu Alloy |
| Tip Plating for DUT | WJ3 |
| Tip Base for Loadboard | BeCu Alloy |
| Tip Plating for Loadboard | WJ3 |
| Barrel Base | Phosphor Bronze |
| Barrel Plating | Au |
| Spring Base | SUS with Au plated |
| Full Travel | 0.8 |
| Recommended Travel | 0.5 |
| Spring Force | 20 |
| Life Cycle | 200K |
| Operating Temperature | -55~175 |