Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A
Category
IC Test Probes
Part Number
DE1-028DF40-01B0-S
Structure
Double Active
Length
5.70
Barrel Outer Diameter
0.28
Tip for DUT
4 Points Crown(F)
Rated Current
1
Contact Resistance
150
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Ships from Taiwan
Lead Time 21

Product Specifications

Impedance 48.28
Insertion Loss -1dB>20GHz
Return Loss -20dB@8.31GHz
Tip Base for DUT BeCu Alloy
Tip Plating for DUT Au
Tip Base for Loadboard BeCu Alloy
Tip Plating for Loadboard Au
Barrel Base Phosphor Bronze
Barrel Plating Au
Spring Base SWP with Au plated
Full Travel 1
Recommended Travel 0.65
Spring Force 28
Life Cycle 200K
Operating Temperature -15~125

Description

DE1-028DF40-01B0-S