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Double active, 6.98mm, IC Test Probe, 0.35mm Diameter, DE1-035DF56-02A0
Double active, 6.98mm, IC Test Probe, 0.35mm Diameter, DE1-035DF56-02A0
| Category |
IC Test Probes
|
| Part Number |
DE1-035DF56-02A0
|
| Structure |
Double Active
|
| Length |
6.98
|
| Barrel Outer Diameter | |
| Tip for DUT |
Sphere(D)
|
| Tip for Load Board |
4 Points Crown(F)
|
| Datasheet | DE1-035DF56-02A0.pdf |
| 3D CAD | DE1-035DF56-02A0.STEP |
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| Ships from | Taiwan |
Product Specifications
| Tip Base for DUT | SK4 |
| Tip Plating for DUT | Au |
| Tip Base for Loadboard | SK4 |
| Tip Plating for Loadboard | Au |
| Barrel Base | PhBz |
| Barrel Plating | Au |
| Spring Base | SUS |
| Spring Plating | Au |
| Full Travel | 0.9mm |
| Recommended Travel | 0.5mm |
| Spring Force | 6g |
| Life Cycle | 200,000 |
Description
Replacement Pin for ECT CSP5-22