Тестовые зонды для ИС
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-05A0
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Тестовые зонды для ИС
DE1-028EF40-05A0
Тестовые зонды для ИС
Part No.:DE1-028EF40-05A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
4 Pts Serrated (P)
Load Board Tip Type
Conical 90°, 120° (E)
Resistance
250mΩ
Spring Force
28g
Description
DE1-028EF40-05A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip Type4 Points Serrated(P)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force28 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles
Contact Resistance250 mΩ
Lead Time21 days
Impedance48.28 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@8.31GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialSK4
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

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