ĐầU Dò KIểM THử IC
4.60 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026EF31-01A0
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Đầu dò kiểm thử IC
DE1-026EF31-01A0
Đầu dò kiểm thử IC
Part No.:DE1-026EF31-01A0
Double Active
Length
4.60mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
Conical 90°, 120° (E)
Load Board Tip Type
4 Pts Crown (F)
Resistance
175mΩ
Spring Force
20g
Description
DE1-026EF31-01A0 is a 4.60 mm long IC test probe with a barrel diameter of 0.26 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length4.60 mm
Barrel OD0.26 mm
DUT Contact Tip TypeConical 90°, 120° (E)
LB Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.5 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
Contact Resistance175 mΩ
Lead Time21 days
Impedance56.4 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@5.11GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialSK4
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated
Operating Temperature-55~150 °C

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