ĐầU Dò KIểM THử IC
4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF32-01C0
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Đầu dò kiểm thử IC
DE1-031BF32-01C0
Đầu dò kiểm thử IC
Part No.:DE1-031BF32-01C0
Double Active
Length
4.75mm
Tube OD
0.31mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Conical 60° (B)
Resistance
175mΩ
Spring Force
25g ±20%
Description
DE1-031BF32-01C0 is a 4.75 mm long IC test probe with a barrel diameter of 0.31 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length4.75 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
LB Contact Tip TypeConical 60°(B)
Contact Resistance175 mΩ
Lead Time21 days
Impedance41.16 Ω
Insertion Loss-1dB@10.54GHz
Return Loss-20dB@3.47GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Total Travel0.85 mm
Recommended Travel0.6 mm
Spring Force25 g ±20%
Life Cycles200,000 cycles
Operating Temperature-15~125 °C

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