IC 测试探针
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DD40-01A0
首页 › 测试解决方案 › IC 测试探针 › DE1-028DD40-01A0
IC 测试探针
DE1-028DD40-01A0
IC 测试探针
Part No.:DE1-028DD40-01A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
Sphere (D)
Load Board Tip Type
Sphere (D)
Resistance
300mΩ
Spring Force
25g
Description
DE1-028DD40-01A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
Rated Current1A
Spring Force25 g ±20%
Recommended Travel0.65 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
Contact Resistance300 mΩ
Lead Time21 days
Impedance49.51 Ω
Insertion Loss-1dB>17.64GHz
Return Loss-20dB@8.35GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialSK4
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated
Operating Temperature-55~150 °C

Please fill in your details before downloading

Thank you for your interest — download below

Thank you for your interest — download below