IC 测试探针
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028DF40-01B0
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IC 测试探针
DE1-028DF40-01B0
IC 测试探针
Part No.:DE1-028DF40-01B0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Resistance
150mΩ
Spring Force
28g
Description
DE1-028DF40-01B0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force28 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles
Contact Resistance150 mΩ
Lead Time21 days
Impedance48.28 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@8.31GHz
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

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