IC-PRüFNADELN
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026BF40-01A0
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IC-Prüfnadeln
DE1-026BF40-01A0
IC-Prüfnadeln
Part No.:DE1-026BF40-01A0
Double Active
Length
5.70mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Conical 60° (B)
Resistance
250mΩ
Spring Force
14g
Description
DE1-026BF40-01A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.26 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.26 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 60°(B)
Rated Current1A
Spring Force14 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles
Contact Resistance250 mΩ
Lead Time21 days
Impedance56.03 Ω
Insertion Loss-1dB@17.93GHz
Return Loss-20dB@5.03GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialSK4
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated
Operating Temperature-55~150 °C

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