IC-PRüFNADELN
6.86 mm, IC Test Probes, 0.35 mm Diameter, 1A, DE1-035EG57-01A0
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IC-Prüfnadeln
DE1-035EG57-01A0
IC-Prüfnadeln
Part No.:DE1-035EG57-01A0
Double Active
Length
6.86mm
Tube OD
0.35mm
Rated Current
1A
DUT Tip Type
Conical 90°, 120° (E)
Load Board Tip Type
Flat (G)
Resistance
50mΩ
Spring Force
20g
Description
DE1-035EG57-01A0 is a 6.86 mm long IC test probe with a barrel diameter of 0.35 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length6.86 mm
Barrel OD0.35 mm
DUT Contact Tip TypeConical 90°, 120° (E)
LB Contact Tip TypeFlat(G)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.6 mm
Total Travel0.8 mm
Life Cycles200,000 cycles
Contact Resistance50 mΩ
Lead Time21 days
DUT Tip Base MaterialBeCu
DUT Tip PlatingAu
LB Tip Base MaterialBeCu
LB Tip PlatingAu
Barrel Base MaterialPhBz
Barrel PlatingAu
Spring Base MaterialSUS with Gold Plating

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