IC TEST PROBES
5.70 mm, IC Test Probes, 0.31 mm Diameter, 1A, DE1-031BF40-02C0
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IC Test Probes
DE1-031BF40-02C0
IC Test Probes
Part No.:DE1-031BF40-02C0
Double Active
Length
5.70mm
Tube OD
0.31mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Conical 60° (B)
Resistance
175mΩ
Spring Force
25g ±20%
Description
DE1-031BF40-02C0 is a 5.70 mm long IC test probe with a barrel diameter of 0.31 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
LB Contact Tip TypeConical 60°(B)
Contact Resistance175 mΩ
Lead Time21 days
Impedance40.68 Ω
Insertion Loss-1dB@10.42GHz
Return Loss-20dB@2.76GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Recommended Travel0.65 mm
Spring Force25 g ±20%
Life Cycles200,000 cycles
Operating Temperature-15~125 °C

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