ICテストプローブ
5.70 mm, IC Test Probes, 0.26 mm Diameter, 1A, DE1-026DF40-02A0
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ICテストプローブ
DE1-026DF40-02A0
ICテストプローブ
Part No.:DE1-026DF40-02A0
Double Active
Length
5.70mm
Tube OD
0.26mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Resistance
500mΩ
Spring Force
18g
Description
DE1-026DF40-02A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.26 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.26 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force18 g ±20%
Recommended Travel0.65 mm
Total Travel0.85 mm
Life Cycles200,000 cycles
Contact Resistance500 mΩ
Lead Time21 days
Impedance55.02 Ω
Insertion Loss-1db>18.77GHz
Return Loss-20dB@6.82GHz
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated
Operating Temperature-55~-150 °C

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