IC 테스트 프로브
2.57 mm, IC Test Probes, 0.52 mm Diameter, 1A, DE4-052DF17-01F0
홈 › 테스트 솔루션 › IC 테스트 프로브 › DE4-052DF17-01F0
IC 테스트 프로브
DE4-052DF17-01F0
IC 테스트 프로브
Part No.:DE4-052DF17-01F0
Single Active
Length
2.57mm
Tube OD
0.52mm
Rated Current
1A
DUT Tip Type
4 Points Crown (F)
Resistance
100mΩ
Spring Force
35g
Description
DE4-052DF17-01F0 is a 2.57 mm IC test probe with a barrel outer diameter of 0.52 mm and a rated current of 1A. Featuring a Single Active structure, it is designed for semiconductor IC testing applications.
Product Specifications
StructureSingle Active
Length2.57 mm
Barrel OD0.52 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force35 g ±20%
Recommended Travel0.4 mm
Total Travel0.55 mm
Life Cycles200,000 cycles
Contact Resistance100 mΩ
Impedance36.01 Ω
Insertion Loss-1dB@15.16GHz
Return Loss-20dB@3.26GHz
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

Please fill in your details before downloading

Thank you for your interest — download below

Thank you for your interest — download below