IC 테스트 프로브
3.30 mm, IC Test Probes, 0.31 mm Diameter, 1A, PE4-031DF24-01F0
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IC 테스트 프로브
PE4-031DF24-01F0
IC 테스트 프로브
Part No.:PE4-031DF24-01F0
Single Active
Length
3.30mm
Tube OD
0.31mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Resistance
100mΩ
Spring Force
35g
Description
PE4-031DF24-01F0 is a 3.30 mm long IC test probe with a barrel diameter of 0.31 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.30 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force35 g ±20%
Recommended Travel0.4 mm
Total Travel0.5 mm
Life Cycles200,000 cycles
Contact Resistance100 mΩ
Lead Time21 days
Impedance46.2 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@7.46GHz
DUT Tip Base MaterialPd Alloy
DUT Tip Platingn/a
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

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