IC 테스트 프로브
3.20 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-03F0
홈 › 테스트 솔루션 › IC 테스트 프로브 › PE4-035DF24-03F0
IC 테스트 프로브
PE4-035DF24-03F0
IC 테스트 프로브
Part No.:PE4-035DF24-03F0
Single Active
Length
3.20mm
Tube OD
0.35mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Resistance
150mΩ
Spring Force
30g
Description
PE4-035DF24-03F0 is a 3.20 mm long IC test probe with a barrel diameter of 0.35 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.20 mm
Barrel OD0.35 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force30 g ±20%
Recommended Travel0.4 mm
Total Travel0.5 mm
Life Cycles200,000 cycles
Contact Resistance150 mΩ
Lead Time21 days
Impedance39.47 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@4.18GHz
DUT Tip Base MaterialPd Alloy
DUT Tip Platingn/a
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

Please fill in your details before downloading

Thank you for your interest — download below

Thank you for your interest — download below