ĐầU Dò KIểM THử IC
7.80 mm, IC Test Probes, 0.38 mm Diameter, 1A, DE1-038FF50-03F0
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Đầu dò kiểm thử IC
DE1-038FF50-03F0
Đầu dò kiểm thử IC
Part No.:DE1-038FF50-03F0
Double Active
Length
7.80mm
Tube OD
0.38mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
4 Pts Crown (F)
Resistance
225mΩ
Spring Force
22g
Description
DE1-038FF50-03F0 is a 7.80 mm long IC test probe with a barrel diameter of 0.38 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length7.80 mm
Barrel OD0.38 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force22 g ±20%
Recommended Travel1 mm
Total Travel1.2 mm
Life Cycles200,000 cycles
Contact Resistance225 mΩ
Lead Time21 days
Impedance43.29 Ω
Insertion Loss-1dB@12.98GHz
Return Loss-20dB@3.20GHz
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

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