IC 测试探针
3.30 mm, IC Test Probes, 0.31 mm Diameter, DE3-031DF21-01A0
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IC 测试探针
DE3-031DF21-01A0
IC 测试探针
Part No.:DE3-031DF21-01A0
Single Active
Length
3.30mm
Tube OD
0.31mm
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Sphere (D)
Spring Force
30g
Description
DE3‑031DF21‑01A0 is a 3.30 mm‑long IC test probe with a 0.31 mm barrel outer diameter. It features a Single Active structure and is designed for semiconductor IC testing applications.
Product Specifications
StructureSingle Active
Length3.30 mm
Barrel OD0.31 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeSphere(D)
Spring Force30 g ±20%
Recommended Travel0.4 mm
Total Travel0.55 mm
Life Cycles200,000 cycles
Lead Time28 days
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP
Spring PlatingAu

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