IC 测试探针
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028BE40-04A0
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IC 测试探针
DE1-028BE40-04A0
IC 测试探针
Part No.:DE1-028BE40-04A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
Conical 60° (B)
Load Board Tip Type
Conical 90°, 120° (E)
Resistance
250mΩ
Spring Force
20g
Description
DE1-028BE40-04A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip TypeConical 60°(B)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.65 mm
Total Travel1 mm
Life Cycles200,000 cycles
Contact Resistance250 mΩ
Lead Time21 days
Impedance49.73 Ω
Insertion Loss-1dB>18.73GHz
Return Loss20dB@8.60GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialSK4
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated
Operating Temperature-15~125 °C

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