IC 测试探针
3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A, PE4-035DF24-01F0
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IC 测试探针
PE4-035DF24-01F0
IC 测试探针
Part No.:PE4-035DF24-01F0
Single Active
Length
3.35mm
Tube OD
0.35mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Resistance
75mΩ
Spring Force
32g
Description
PE4-035DF24-01F0 is a 3.35 mm long IC test probe with a barrel diameter of 0.35 mm and a rated current of 1A. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.35 mm
Barrel OD0.35 mm
DUT Contact Tip Type4 Points Crown(F)
Rated Current1A
Spring Force32 g ±20%
Recommended Travel0.45 mm
Total Travel0.7 mm
Life Cycles200,000 cycles
Contact Resistance75 mΩ
Lead Time21 days
Impedance35.8 Ω
Insertion Loss-1dB>20GHz
Return Loss-20dB@3.94GHz
DUT Tip Base MaterialPd Alloy
DUT Tip Platingn/a
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated
Operating Temperature-15~150 °C

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