IC TEST PROBES
2.00 mm, IC Test Probes, 0.35 mm Diameter, DE1-035BE12-01B0
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IC Test Probes
DE1-035BE12-01B0
IC Test Probes
Part No.:DE1-035BE12-01B0
Double Active
Length
2.00mm
Tube OD
0.35mm
DUT Tip Type
Conical 60° (B)
Load Board Tip Type
Conical 90°, 120° (E)
Spring Force
20g ±20%
Description
DE1-035BE12-01B0 is a 2.00 mm long IC test probe with a barrel diameter of 0.35 mm. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length2.00 mm
Barrel OD0.35 mm
DUT Contact Tip TypeConical 60°(B)
LB Contact Tip TypeConical 90°,120°(E)
Spring Force20 g ±20%
Recommended Travel0.3 mm
Total Travel0.4 mm
Life Cycles200,000 cycles
Lead Time21 days
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated

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