IC TEST PROBES
3.20 mm, IC Test Probes, 0.35 mm Diameter, DE4-035DF24-03F0
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IC Test Probes
DE4-035DF24-03F0
IC Test Probes
Part No.:DE4-035DF24-03F0
Single Active
Length
3.20mm
Tube OD
0.35mm
DUT Tip Type
4 Pts Crown (F)
Spring Force
30g ±20%
Description
DE4-035DF24-03F0 is a 3.20 mm long IC test probe with a barrel diameter of 0.35 mm. It uses a Single Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureSingle Active
Length3.20 mm
Barrel OD0.35 mm
DUT Contact Tip Type4 Points Crown(F)
Spring Force30 g ±20%
Recommended Travel0.4 mm
Total Travel0.5 mm
Life Cycles200,000 cycles
Lead Time21 days
DUT Tip Base MaterialBeCu Alloy
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSWP with Au plated

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