C.C.P. Contact Probes Co., LTD.
Testing Standards
Others
| Testing Items | Reference Document |
|---|---|
| Drop Test | Refer to Drop Test Standard of Molex |
| Side Force | Refer to Side Force Standard of BENQ |
| Solder Ability | EIA-364-52 |
Environmental Testing
| Testing Items | Reference Document |
|---|---|
| Humidity | EIA-364-31, Test method II, Condition A |
| Salt Spray | EIA-364-26, Test condition B |
| Temperature Life | EIA-364-17, Test method A, condition 4, Test time condition A |
| Thermal Shock (Cycling) | EIA-364-32, Test condition VIII |
| Resistance to Solder Heat | EIA-364-56, Procedure 5, Level 2 |
Mechanical Performance
| Testing Items | Reference Document |
|---|---|
| Contact Retention | EIA-364-29, Test method B |
| Durability | EIA-364-09 |
| Spring Force | EIA-364-04 (Normal Force Test Procedure) |
| Random Vibration | EIA-364-28, Test condition II |
| Mechanical Shock | EIA-364-27, Test condition A |
Electrical Performance
| Testing Items | Reference Document |
|---|---|
| LLCR, Contact Resistance | EIA-364-23 |
| Insulation Resistance | EIA-364-21 |
| Dielectric Withstand Voltage | EIA-364-20, Test method B |
| Current Rating | EIA-364-70, Test method 1 |