ICテストプローブ
5.70 mm, IC Test Probes, 0.28 mm Diameter, 1A, DE1-028EF40-06A0
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ICテストプローブ
DE1-028EF40-06A0
ICテストプローブ
Part No.:DE1-028EF40-06A0
Double Active
Length
5.70mm
Tube OD
0.28mm
Rated Current
1A
DUT Tip Type
4 Pts Crown (F)
Load Board Tip Type
Conical 90°, 120° (E)
Resistance
350mΩ
Spring Force
20g
Description
DE1-028EF40-06A0 is a 5.70 mm long IC test probe with a barrel diameter of 0.28 mm and a rated current of 1A. It uses a Double Active structure and is suitable for semiconductor IC test applications.
Product Specifications
StructureDouble Active
Length5.70 mm
Barrel OD0.28 mm
DUT Contact Tip Type4 Points Crown(F)
LB Contact Tip TypeConical 90°, 120° (E)
Rated Current1A
Spring Force20 g ±20%
Recommended Travel0.7 mm
Total Travel1 mm
Life Cycles200,000 cycles
Contact Resistance350 mΩ
Lead Time21 days
Impedance49.6 Ω
Insertion Loss-1dB@17.49GHz
Return Loss-20dB@7.92GHz
DUT Tip Base MaterialSK4
DUT Tip PlatingAu
LB Tip Base MaterialBeCu Alloy
LB Tip PlatingAu
Barrel Base MaterialPhosphor Bronze
Barrel PlatingAu
Spring Base MaterialSUS with Au plated
Operating Temperature-55~150 °C

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