C.C.P. Contact Probes Co., LTD.
Double active, 4.75 mm, IC Test Probes, 0.3 mm Diameter, A
Double active, 4.75 mm, IC Test Probes, 0.3 mm Diameter, A
| Category |
IC Test Probes
|
| Part Number |
PE1-030DF32-01F0
|
| Structure |
Double Active
|
| Length |
4.75
|
| Barrel Outer Diameter | |
| Tip for DUT |
4 Points Crown(F)
|
| Tip for Load Board |
| Datasheet | PE1-030DF32-01F0 Datasheet.pdf |
| 3D CAD | PE1-030DF32-01F0.STEP |
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| Ships from | Taiwan |
| Lead Time | 21 |
Product Specifications
| Tip Base for DUT | Pd Alloy |
| Tip Plating for DUT | n/a |
| Tip Base for Loadboard | BeCu Alloy |
| Tip Plating for Loadboard | Au |
| Barrel Base | Phosphor Bronze |
| Barrel Plating | Au |
| Spring Base | SUS with Au plated |
| Full Travel | 0.85 |
| Recommended Travel | 0.7 |
| Spring Force | 38 |
| Life Cycle | 200K |