Testing Solutions
Introduction
Learn more about about our capabilities and processes in the semiconductor testing field.
Introduction
IC Test Probes
80 Designs
Our IC Test Probes are suitable for pitches of less than 0.012mm.
Introduction
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ICT Test Probes
70 Designs
Our In-Circuit Test Probes are used for all kinds PCB tests. We offer a standard portfolio as well as customized parts
Introduction
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General Final Test
CCP designs and manufactures custom made test sockets.
Introduction
Wafer Level Test
Min Pitch 0.12mm
We develop your individual WLCSP design.
Introduction
Burn In Test
≤ 180°C
Customized Burn In Test Sockets for temperatures of up to 180°C.
Introduction
High Frequency Testing
≤ 77 GHz
CCP designs high frequency testing probes, coaxial probe sockets and pressurized conductive rubber sockets.
Introduction
Battery Probes
30 Designs
CCP offers a variety of different high current battery testing probes.
Introduction
Memory Testing
DDR SDRAM, Flash, etc.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
Introduction
High Current IC Test
> 5 Amps
Our patented probe design allows very high currents of up to 5 Amps.
Introduction
Fine Pitch Connector Test
≤ 0.3mm
Our Ceramic/Aluminum sockets have a life time of up to 30,000 cycles.
Introduction
Kelvin Contact Test
0.07 ~ 0.1mm
We offer different tip types for low resistance testing.
Introduction
ATE Connecting Solutions
Pogo Tower & Adapter
Customized pogo towers with high frequency capability.
Introduction
Panel Test Solutions
Min Pitch 0.45mm
CCP offers special rounded pins and test modules for panel testing.
Introduction

Can't find what you want?

CCP provides a wide variety of testing sockets and probes. You have a specific requirement or a totally new requirement?

Our Engineers looking forward to taking on your challenge!

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