CCP offers the full range of testing solutions, from fine pitch 0.007mm IC Probes, Burn-In, WLCSP, Final Test to ICT Testing Solutions. Our solutions are used by industry leaders such as TSMC, Foxconn, Intel, SPIL ,and Skyworks.
Battery Probes
High Current IC Test
High Frequency (RF) Testing
Kelvin Contact Test
Memory Testing
Burn-In Test
Fine Pitch Connector Test
IC Test Probes
ATE Connecting Solutions
ICT Test Probes
Testing Solutions
General Final Test
Panel Test Solutions
Wafer Level Test
Testing Solutions
Introduction
Discover our capabilities in the testing of semiconductors!