C.C.P. Contact Probes Co., LTD.

Testing Solutions
Introduction
Discover our capabilities in the testing of semiconductors!

IC Test Probes
80 Designs
Our IC Test Probes are suitable for pitches of less than 0.012mm.

ICT Test Probes
70 Designs
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts




High Frequency (RF) Testing
≤ 77 GHz
CCP designs high-frequency testing probes, coaxial probe sockets, and pressurized conductive rubber sockets.

Battery Probes
30 Designs
CCP offers a variety of different high current battery testing probes.

Memory Testing
DDR SDRAM, Flash, etc.
Standard and Custom test solutions for RAM, Flash and many other memory chips.

High Current IC Test
> 5 Amps
Our patented probe design allows very high currents of up to 5 Amps.

Fine Pitch Connector Test
≤ 0.3mm
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.

Kelvin Contact Test
0.07 ~ 0.1mm
We offer different tip types for low resistance testing.

ATE Connecting Solutions
Pogo Tower & Adapter
Customized pogo towers with high frequency capability.

Panel Test Solutions
Min Pitch 0.45mm
CCP offers special rounded pins and test modules for panel testing.
Every Solution You Are Looking For
CCP provides a wide variety of testing sockets and probes. You have a specific requirement or a totally new requirement?
Our Engineers looking forward to taking on your challenge!