Learn more about about our capabilities and processes in the semiconductor testing field.
IC Test Probes
Our IC Test Probes are suitable for pitches of less than 0.012mm.
ICT Test Probes
Our In-Circuit Test Probes are used for all kinds PCB tests. We offer a standard portfolio as well as customized parts
General Final Test
CCP designs and manufactures custom made test sockets.
Wafer Level Test
Min Pitch 0.12mm
We develop your individual WLCSP design.
Burn In Test
Customized Burn In Test Sockets for temperatures of up to 180°C.
High Frequency Testing
≤ 77 GHz
CCP designs high frequency testing probes, coaxial probe sockets and pressurized conductive rubber sockets.
CCP offers a variety of different high current battery testing probes.
DDR SDRAM, Flash, etc.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
High Current IC Test
> 5 Amps
Our patented probe design allows very high currents of up to 5 Amps.
Fine Pitch Connector Test
Our Ceramic/Aluminum sockets have a life time of up to 30,000 cycles.
Kelvin Contact Test
0.07 ~ 0.1mm
We offer different tip types for low resistance testing.
ATE Connecting Solutions
Pogo Tower & Adapter
Customized pogo towers with high frequency capability.
Panel Test Solutions
Min Pitch 0.45mm
CCP offers special rounded pins and test modules for panel testing.
Can't find what you want?
CCP provides a wide variety of testing sockets and probes. You have a specific requirement or a totally new requirement?
Our Engineers looking forward to taking on your challenge!