C.C.P. Contact Probes Co., LTD.
Double active, 6.86mm, IC Test Probe, 0.35mm Diameter, 1A, DE1-035EG57-01A0
Double active, 6.86mm, IC Test Probe, 0.35mm Diameter, 1A, DE1-035EG57-01A0
| Category |
IC Test Probes
|
| Part Number |
DE1-035EG57-01A0
|
| Structure |
Double Active
|
| Length |
6.86
|
| Barrel Outer Diameter | |
| Tip for DUT |
Conical 90º,120º(E)
|
| Tip for Load Board |
Flat(G)
|
| Rated Current |
1
|
| Contact Resistance |
50
|
| Datasheet | DE1-035EG57-01A0.pdf |
| 3D CAD | DE1-035EG57-01A0.step |
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| Ships from | Taiwan |
| Lead Time | 21 |
Product Specifications
| Tip Base for DUT | BeCu |
| Tip Plating for DUT | Au |
| Tip Base for Loadboard | BeCu |
| Tip Plating for Loadboard | Au |
| Barrel Base | PhBz |
| Barrel Plating | Au |
| Spring Base | SUS with Gold Plating |
| Full Travel | 0.8 |
| Recommended Travel | 0.6 |
| Spring Force | 20 |
| Life Cycle | 200000 |