C.C.P. Contact Probes Co., LTD.
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
| Category |
IC Test Probes
|
| Part Number |
CM-M2-075-20147
|
| Structure |
Single Active
|
| Length |
25.93
|
| Barrel Outer Diameter | |
| Tip for DUT |
Cup(A)
|
| Rated Current |
3
|
| Datasheet | CM-M2-075-20147 -.pdf |
| 3D CAD | CM-M2-075-20147.STEP |
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| Ships from | Taiwan |
| Lead Time | 28 |
Product Specifications
| Tip Base for DUT | BeCu |
| Tip Plating for DUT | Gold |
| Barrel Base | PhBz |
| Barrel Plating | Gold |
| Spring Base | SWP |
| Spring Plating | Gold |
| Full Travel | 2 |
| Recommended Travel | 1 |
| Spring Force | 150 |
| Life Cycle | 100000 |
Description
CM-M2-075-20147 Single ended IC Test probe with a cone head, Gold plated.