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Single active, 3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A
Single active, 3.35 mm, IC Test Probes, 0.52 mm Diameter, 1A
| Category |
IC Test Probes
|
| Part Number |
DE4-052EF23-02F0
|
| Structure |
Single Active
|
| Length |
3.35
|
| Barrel Outer Diameter | |
| Tip for DUT |
4 Points Crown(F)
|
| Tip for Load Board |
Conical 90º,120º(E)
|
| Rated Current |
1
|
| Contact Resistance |
50
|
| Datasheet | DE4-052EF23-02F0 Datasheet.pdf |
| 3D CAD | DE4-052EF23-02F0.STEP |
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| Ships from | Taiwan |
| Lead Time | 21 |
Product Specifications
| Impedance | 41.5 |
| Insertion Loss | -1dB>20GHz |
| Return Loss | -20dB@3.45GHz |
| Tip Base for DUT | BeCu Alloy |
| Tip Plating for DUT | Au |
| Tip Base for Loadboard | BeCu Alloy |
| Tip Plating for Loadboard | Au |
| Barrel Base | Phosphor Bronze |
| Barrel Plating | Au |
| Spring Base | SWP with Au plated |
| Full Travel | 0.65 |
| Recommended Travel | 0.45 |
| Spring Force | 35 |
| Life Cycle | 200K |
| Operating Temperature | -15~125 |