Electron Microscope

  • Cold field emission (CFE) gun optimized for low-voltage, high-resolution imaging with low aberration
    (Regulus8220/8230/8240: 0.7 nm/1 kV; Regulus8100: 0.8 nm/1 kV)
  • Maximum magnification doubled from 1 million times to 2 million times*2
  • User-support functions to ensure high performance
Hitachi S-4800 SEM
The electron microscope is mostly used in the development stage to research different material characteristics.